Deposition Summary
Depositor: Abraham Levitan
Contact: [email protected]
Deposition date: 2020-11-24
Last modified: 2020-11-24
DOI: 10.11577/1722945
Publication Details
Title: Single-frame far-field diffractive imaging with randomized illumination
Authors: Abraham Levitan et al.
Journal: Optics Express
Year: 2020
DOI: 10.1364/OE.397421
Experimental Conditions
Method: Ptychography, Randomized Probe Imaging
Sample: Siemens Star, Fe/Gd Multilayer
Wavelength: 1.75 nm (707 eV)
Lightsource: BESSY II
Beamline: MAXYMUS
Data Files
Raw Data: Siemens_ptycho.cxi (664.72 MB)
Raw Data: Siemens_ss.cxi (558.49 KB)
Raw Data: FeGd_ptycho.cxi (664.72 MB)
Raw Data: FeGd_ss.cxi (558.49 KB)


Contains two transmission ptychography datasets, one collected from a Siemens star, and the second from an Fe/Gd multilayer. Both samples are under illumination from the same randomized zone plate. Each dataset has a single diffraction pattern removed, and these patterns are reported in a separate cxi file. Either ptychography dataset can be used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.

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