|CXIDB ID 9|
|Depositor:||Ne-Te Duane Loh|
|Title:||Cryptotomography: reconstructing 3D Fourier intensities from randomly oriented single-shot diffraction patterns|
|Authors:||Ne-Te Duane Loh et al.|
|Journal:||Phys Rev Lett.|
|Method:||Single Particle X-ray Diffraction Imaging|
|Sample:||Iron Oxide Ellipsoids|
These 2000 single-shot diffraction patterns include were either background-scattering only or hits (background-scattering plus diffraction signal from sub-micron ellipsoidal particles at random, undetermined orientations).
Candidate hits were identified by eye, and the remainder were presumed as background. 54 usable, background-subtracted hits in this set (procedure in referenced article) were used to reconstruct the 3D diffraction intensities of the average ellipsoidal particle.