Deposition Summary
Depositor: Henry N. Chapman
Contact: [email protected]
Deposition date: 2011-11-15
Last modified: 2011-07-22
DOI: 10.11577/1096918
Publication Details
Title: High-resolution ab initio three-dimensional X-ray diffraction microscopy
Authors: Henry N. Chapman et al.
Journal: J. Opt. Soc. Am. A
Year: 2006
DOI: 10.1364/JOSAA.23.001179
Experimental Conditions
Method: Tomographic X-ray Diffraction Imaging
Sample: Silicon nitride membrane with a 3D pyramid shape decorated with 50 nm diameter colloidal gold spheres.
Wavelength: 1.65 nm
Lightsource: ALS
Beamline: 9.0.1
Data Files
Diffraction Pattern: cxidb-15.cxi (712.43 MB)


The file contains 125 images corresponding to different tilts of the sample around the y axis at 1 degree intervals. Each image is the result of 4 exposures merged together. For more details see the citation.

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