CXIDB ID 175 | |
Deposition Summary | |
---|---|
Depositor: | Abraham Levitan |
Contact: | [email protected] |
Deposition date: | 2020-11-24 |
Last modified: | 2020-11-24 |
DOI: | 10.11577/1722944 |
Publication Details | |
Title: | Single-frame far-field diffractive imaging with randomized illumination |
Authors: | Abraham Levitan et al. |
Journal: | Optics Express |
Year: | 2020 |
DOI: | 10.1364/OE.397421 |
Experimental Conditions | |
Method: | Ptychography, Randomized Probe Imaging |
Sample: | Siemens Star |
Wavelength: | 532 nm (2.37 eV) |
Lightsource: | Thorlabs CPS532 |
Beamline: | Tabletop |
Data Files | |
Raw Data: | Optical_Data_ptycho.cxi (1.49 GB) |
Raw Data: | Optical_Data_ss.cxi (7.64 MB) |
Raw Data: | Optical_Data_ss_defocused.cxi (3.83 MB) |
Description
Contains a transmission ptychography dataset collected from a chrome on glass Siemens star under optical illumination. The probe is generated by a randomized zone plate under illumination from a spatially filtered green laser. A single diffraction pattern was removed from the dataset and reported in a separate cxi file. In addition, a single exposure collected after manually defocusing the probe is reported. The ptychography dataset is used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.