Deposition Summary
Depositor: Abraham Levitan
Contact: [email protected]
Deposition date: 2020-11-24
Last modified: 2020-11-24
DOI: 10.11577/1722944
Publication Details
Title: Single-frame far-field diffractive imaging with randomized illumination
Authors: Abraham Levitan et al.
Journal: Optics Express
Year: 2020
DOI: 10.1364/OE.397421
Experimental Conditions
Method: Ptychography, Randomized Probe Imaging
Sample: Siemens Star
Wavelength: 532 nm (2.37 eV)
Lightsource: Thorlabs CPS532
Beamline: Tabletop
Data Files
Raw Data: Optical_Data_ptycho.cxi (1.49 GB)
Raw Data: Optical_Data_ss.cxi (7.64 MB)
Raw Data: Optical_Data_ss_defocused.cxi (3.83 MB)


Contains a transmission ptychography dataset collected from a chrome on glass Siemens star under optical illumination. The probe is generated by a randomized zone plate under illumination from a spatially filtered green laser. A single diffraction pattern was removed from the dataset and reported in a separate cxi file. In addition, a single exposure collected after manually defocusing the probe is reported. The ptychography dataset is used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.

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