CXIDB ID 176
Deposition Summary
Depositor: Abraham Levitan
Contact: [email protected]
Deposition date: 2020-11-24
Last modified: 2020-11-24
DOI: 10.11577/1722945
Publication Details
Title: Single-frame far-field diffractive imaging with randomized illumination
Authors: Abraham Levitan et al.
Journal: Optics Express
Year: 2020
DOI: 10.1364/OE.397421
Experimental Conditions
Method: Ptychography, Randomized Probe Imaging
Sample: Siemens Star, Fe/Gd Multilayer
Wavelength: 1.75 nm (707 eV)
Lightsource: BESSY II
Beamline: MAXYMUS
Data Files
Raw Data: Siemens_ptycho.cxi (664.72 MB)
Raw Data: Siemens_ss.cxi (558.49 KB)
Raw Data: FeGd_ptycho.cxi (664.72 MB)
Raw Data: FeGd_ss.cxi (558.49 KB)

Description

Contains two transmission ptychography datasets, one collected from a Siemens star, and the second from an Fe/Gd multilayer. Both samples are under illumination from the same randomized zone plate. Each dataset has a single diffraction pattern removed, and these patterns are reported in a separate cxi file. Either ptychography dataset can be used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.

Licensed under the CC0 Public Domain Dedication Waiver.

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