CXIDB ID 176 | |
Deposition Summary | |
---|---|
Depositor: | Abraham Levitan |
Contact: | [email protected] |
Deposition date: | 2020-11-24 |
Last modified: | 2020-11-24 |
DOI: | 10.11577/1722945 |
Publication Details | |
Title: | Single-frame far-field diffractive imaging with randomized illumination |
Authors: | Abraham Levitan et al. |
Journal: | Optics Express |
Year: | 2020 |
DOI: | 10.1364/OE.397421 |
Experimental Conditions | |
Method: | Ptychography, Randomized Probe Imaging |
Sample: | Siemens Star, Fe/Gd Multilayer |
Wavelength: | 1.75 nm (707 eV) |
Lightsource: | BESSY II |
Beamline: | MAXYMUS |
Data Files | |
Raw Data: | Siemens_ptycho.cxi (664.72 MB) |
Raw Data: | Siemens_ss.cxi (558.49 KB) |
Raw Data: | FeGd_ptycho.cxi (664.72 MB) |
Raw Data: | FeGd_ss.cxi (558.49 KB) |
Description
Contains two transmission ptychography datasets, one collected from a Siemens star, and the second from an Fe/Gd multilayer. Both samples are under illumination from the same randomized zone plate. Each dataset has a single diffraction pattern removed, and these patterns are reported in a separate cxi file. Either ptychography dataset can be used for calibration of the probe function, and the remaining diffraction patterns can be reconstructed via randomized probe imaging.