CXIDB ID 178
Deposition Summary
Depositor: Benedikt J. Daurer
Contact: [email protected]
Deposition date: 2020-12-28
Last modified: 2020-12-28
DOI: 10.11577/
Publication Details
Title: Ptychographic wavefront characterisation for single-particle imaging at X-ray lasers
Authors: Benedikt J. Daurer et al.
Journal:
Year:
DOI:
Experimental Conditions
Method: Ptychography
Sample: Siemens Star
Wavelength: 0.984 nm (1.26 keV)
Lightsource: LCLS
Beamline: AMO
Data Files
Raw Data: data_set_1_original.h5 (42.2 MB)
Raw Data: data_set_2_corrected.h5 (743.11 MB)
Raw Data: data_set_3_single.h5 (562.77 MB)
Auxiliary Files
Probe Modes: orthogonal_probe_modes.h5 (1.41 MB)

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