Deposition Summary
Depositor: Hugh T. Philipp
Contact: [email protected]
Deposition date: 2012-06-20
Last modified: 2012-06-20
DOI: 10.11577/1096923
Publication Details
Title: Solving structure with sparse, randomly-oriented x-ray data
Authors: Hugh T. Philipp, Kartik Ayyer, Mark W. Tate, Veit Elser & Sol M. Gruner
Journal: Optics Express
Year: 2012
DOI: 10.1364/OE.20.013129
Experimental Conditions
Method: X-ray Projection Imaging
Sample: Lead mask
Wavelength: 1.55 Å
Lightsource: In-house, TruFocus TFS 6050 Cu
Data Files
Diffraction Patterns: cxidb-18-025photons.cxi (92.36 MB)
Diffraction Patterns: cxidb-18-115photons.cxi (252.01 MB)
Auxiliary Files
Format Description: FORMAT (1.09 KB)
Pixel Map: detector.dat (189.03 KB)
Detector Geometry: detarray.dat (170.61 KB)
Alternative Formats
Diffraction Patterns: 025photons.dat (EMC format) (9.38 MB)
Diffraction Patterns: 115photons.dat (EMC format) (29.19 MB)

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