Deposition Summary
Depositor: Ne-Te Duane Loh
Contact: [email protected]
Deposition date: 2011-08-01
Last modified: 2011-02-23
DOI: 10.11577/1096911
Publication Details
Title: Cryptotomography: reconstructing 3D Fourier intensities from randomly oriented single-shot diffraction patterns
Authors: Ne-Te Duane Loh et al.
Journal: Phys Rev Lett.
Year: 2010
DOI: 10.1103/PhysRevLett.104.225501
Experimental Conditions
Method: Single Particle X-ray Diffraction Imaging
Sample: Iron Oxide Ellipsoids
Wavelength: 7 nm
Lightsource: FLASH
Beamline: BL2
Data Files
Diffraction Patterns: cxidb-9.tar.gz (659.85 MB)


These 2000 single-shot diffraction patterns include were either background-scattering only or hits (background-scattering plus diffraction signal from sub-micron ellipsoidal particles at random, undetermined orientations).

Candidate hits were identified by eye, and the remainder were presumed as background. 54 usable, background-subtracted hits in this set (procedure in referenced article) were used to reconstruct the 3D diffraction intensities of the average ellipsoidal particle.

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